Power semiconductor wafer simultaneous measurement test system
It is possible to measure up to 32 wafers of power semiconductors.
The test box enables simultaneous measurement of power semiconductor wafers, ranging from 1 to a maximum of 32, by combining them with our test system. The test box is compatible with probe cards from other manufacturers, allowing connections with probe cards from different makers. Additionally, the main test system supports up to 2000V/30A, making it ideal for measuring power semiconductors such as IGBTs, FRDs, SBDs, and MOSFETs.
